Program Committee

Bialek, Janusz Durham University, UK
Bots, Pieter Delft University of Technology, The Netherlands
Bouwman, Harry Delft University of Technology, The Netherlands
Frances Brezier Delft University of Technology, The Netherlands
Chatzimisios, Periklis Technological Educational Institution of Thessaloniki, Greece
Chen, Shu-Ching Florida International University, USA
Chen, YangQuan Utah State University, USA
Choi, Ken Illinois Institute of Technology, USA
Costa, Jose Federal University (UFRN), Brazil
DasGupta, Bhaskar University of Illinois at Chicago, USA
De Schutter, Bart Delft University of Technology, The Netherlands
Deng, Mingcong Okayama University, Japan
Duan, Haibin Beihang University, China
Ghasemi Afshar, Puya Manchester University, United Kingdom
Gustavsson, Rune Blekinge Institute of Technology, Sweden
Hadjsaid, Nouredine Grenoble Electrical Eng Laboratory, France
He, David University of Illinois at Chicago, USA
Herder, Paulien Delft University of Technology, The Netherlands
Hong Zhao Fairleigh Dickinson University, USA
Hou, Zhongsheng Beijing Jiaotong University, China
Hu, Hesuan Xidian University, China
Hu, Jianghai Purdue University, USA
Huang, Yi-Sheng National Defense University, Taiwan
Jarrahi, Mona University of Michigan, USA
Kroumov, Valeri T. Okayama University of Science, Japan
Kulkarni, Sandeep Michigan State University, USA
Kumara, Soundar Penn State University, USA
Kumarawadu, Sisil University of Moratuwa, Sri Lanka
Langendorfer, Peter IHP microelectronics, Germany
Leirens, Sylvain Universidad de Los Andes, Colombia
Li, Jingshan University of Kentucky, USA
Li, Yuping Delft University of Technology, The Netherlands
Liu, Zhigang Southwest Jiaotong University, China
Lu, Jinhu Chinese Academy of Sciences, China
Lukszo, Zofia Delft University of Technology, The Netherlands
Martinez, Carlos Ocampo Politécnica de Catalunya, Spain
Meng, Dan Southwestern Univ. of Finance and Economics, China
Nadjm-Tehrani, Simin Linköping University, Sweden
Negenborn, Rudy R. Delft University of Technology, The Netherlands
Ni, Min Synopsys Inc., USA
Oruklu, Erdal Illinois Institute of Technology, USA
Pei, Hai-Long South China University of Technology, China
Piazza, Francesco Universita Politecnica delle Marche, Italy
Qiao, Fengxiang Texas Southern University, USA
Rao, Wenjing University of Illinois at Chicago, USA
Schwanenberg, Dirk Deltares, The Netherlands
Shantanu, Pal University of Calcutta, India
Shiau, Jiun-Yan National Kaohsiung First Univ. of Science and Tech., Taiwan
Sodagar, Amir University of Michigan, USA
Tan, Yao-Hua Delft University of Technology, The Netherlands
Tianshu, Bi North China Electric Power University
Torreblanca, Pepe Maestre Universidad de Sevilla, Spain
Trajcevski, Goce Northwestern University, USA
Van Mieghem, Piet Delft University of Technology, The Netherlands
Van Overloop, Peter-Jules Delft University of Technology, The Netherlands
Vrancken, Jos Delft University of Technology, The Netherlands
Wang, Jiacun Monmouth University, USA
Wu, Jian Zhejiang University, China
Wu, Naiqi Guangdong University of Technology, China
Wu, Wenyan Staffordshire University, UK
Wu, Zuobao Westinghouse Electric Company, USA
Xie, Le Texas A&M University, USA
Yang, Zongxiao Henan Univ of Science and Technology, China
Zakrzewska, Danuta Technical University of Lodz, Poland
Zegeye, Solomon Delft University of Technology, The Netherlands
Zhang, Chi Florida International University, USA
Zhao, Hong Fairleigh Dickinson University, USA
Zheng, Wei Xing School of QMMS University of Western Sydney, Australia
Zhou, Chi Illinois Institute of Technology, USA